- Utilizes one to eight channels with low signal-to-noise ratio
- Detects and quantifies flaws, including corrosion, erosion, pitting, cracking and metallurgical defects
- ID inspection of straight tubes, U-bends, or small diameter pipes
- Works with ferrous and non-ferrous metals
- ID or OD scale does not affect signal
- Displays high resolution, real time, 3-D color graphics of the scan results
- Results can be saved for further analysis or permanent archiving
Triton II RFET System
(Remote Field Electromagnetic Technique)
- Provides full circumferential coverage over entire length of tube or pipe
- Probe sizes from 0.21″ (8mm) to 6″ (150mm)
- Probe fill factor can be as low as 40%
- Single channel probes operate in absolute or differential modes
- Multi-channel probes allow for higher flaw resolution
- Flexible probes inspect tubes and pipes with bends
Triton II RFET System Probes
- Unlike competing products, our Triton II RFET system requires minimal surface preparation to be effective
- Faster inspection because less pre-cleaning is required. Our RFET probe does not require a high fill factor and is not affected by scale
- Operates with a wide frequency range (5Hz – 7.5kHz) allowing the system to inspect ferrous and non-ferrous materials
- 300 – 400 tubes can be inspected in a 10 – 12 hour shift
- Probe lengths up to 150 feet without signal pre-amplification
- Probes do not use permanent magnets or electromagnets
Advantages over Competing Technologies
Triton II RFET System
- For IRIS UT, surfaces need to be thoroughly cleaned
- Does not easily penetrate through oxides, scale, deposits and debris
- Slow inspection technique, 100 tubes per shift
- For MFL method, surfaces need to be thoroughly cleaned
- MFL probes need very high fill factor
- Cannot determine flaw sizes
Limitations of Competing Technologies
Internal Rotating Inspection System – Ultrasound (IRIS UT)
Magnetic Flux Leakage (MFL)
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| Description | Quantity | Add to |
|---|---|---|
| Triton II RFET System | ||
| RFET Straight Probe | ||
| RFET Flex Probe |