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Element BFET

Element portable BFET

Element Portable BFET System

(Balanced Field Electromagnetic Technique)

  • Crack detection to a depth of up to 3/8” (9.5 mm) below the surface
  • Minimum surface preparation
  • No couplant required
  • Scanning speed up to 1 ft/sec
  • Able to scan through paints and coatings
  • Real time display of flaws
  • Screen capture function to save flawed images

Element Single Channel Probes

  • Customized to fit any application and weld profile
  • Curved, flat or welded surfaces can be quickly evaluated even through paints and coatings
  • Deep penetration probes available
BFET Scanner examples
Element wave formBFET waveform of a longitudinal crack in a tube

Element System Additional Information

  • Used anywhere cracking is an issue, including both ferrous and nonferrous metals
  • Signal processing eliminates liftoff and noise signals
  • Detects flaws within 1/8″ of surface or 3/8″ with deep penetrating scanner
  • Scans welds of similar and dissimilar metals

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Description Quantity Add to
Element Portable BFET System
BFET single channel Probes

 

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